Leica Leica QWin Modul QXF - Erweiterter Fokus

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  • Überblick

    Used to acquire images at different Z-positions and to combine these into a single image representing the in-focus points. A corresponding depth-map is produced and the surface profile can be displayed along a line. The depth-map can be exported to a 3D visualisation program in order to examine the surface appearance in more detail. This Applet is normally used with a microscope with motorised Z-axis, although it is possible to acquire the images manually by adjusting the fine-focus knob on the microscope.
    This software is licensed for use on a single PC by means of the supplied USB hardware dongle. Leica QWin, any edition, is a pre-requisite.

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